Laboratoire de Mathématiques Raphaël Salem

UMR 6085 CNRS - Université de Rouen Normandie

After reviewing the principles of so-called sampling methods for imaging the geometry of an inclusion from measurements of scattered waves, we will highlight the role of some specific frequencies where some transparent incident waves may exist. While these frequencies must be avoided for these imaging algorithms, their link to the material properties can be a key property for looking inside highly cluttered media. This observation is at the core of some new inversion paradigms we have recently introduced for crack networks and are developing for more general defects… More to say in the talk!